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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
standard by BSI Group, 04/05/2005
Description
Cross References:
ISO 18115:2001
ISO 9334:1995
ISO 9335:1995
ASTM E 1217-00
Product Details
- Published:
- 04/05/2005
- ISBN(s):
- 0580457141
- Number of Pages:
- 26
- File Size:
- 1 file , 590 KB
- Product Code(s):
- 30124424, 30124424, 30124424
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
