JEDEC EIA 323 (R2002) – AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.
Product Details
- Published:
- 03/01/1966
- Number of Pages:
- 9
- File Size:
- 1 file , 300 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
