Original price was: $148.00.$88.80Current price is: $88.80.
Residual Stress Measurement by X-Ray Diffraction
standard by SAE International, 08/01/1971
Description
SAE J784A – Residual Stress Measurement by X-Ray Diffraction
Product Details
- Published:
- 08/01/1971
- File Size:
- 1 file , 8.9 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
