Description

BS PD IEC/TR 61967-1-1 – Integrated circuits. Measurement of electromagnetic emissions

BS PD IEC/TR 61967-1-1:2015 provides guidance for exchanging data generated by near-field scanmeasurements.

The described exchange format could also be used for near-field scan data generated bysimulation or computation software. It should be noted that, although it has been developedfor near-field scan, its use is not restricted to this application. The exchange format can beapplied to emission and immunity near-field scan data in the frequency and time domains.

The scope of this technical report includes neither the methods used for the measurements orsimulations, nor the software and algorithms used for generating the exchange file or forprocessing or viewing the data contained therein.

Cross References:
IEC 60050
IEC 61967-1
ISO 8879
ANSI INCITS 4:1986
IEEE Std 754-2008
IEC TS 61967-3
IEC TS 62132-9
IEC 60050-131
IEC 60050-161
IEC 62132-1

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