Description

BS PD IEC/TR 62878-2-2 – Device embedded substrate

BS PD IEC/TR 62878-2-2:2015, which is a Technical Report, describes the necessary information onelectrical testing for device embedded substrate. This includes the interconnection open- andshort-circuit tests as well as the device functional test. It also provides guidelines bydemonstrating the electrical test for device embedded substrate.

This part of IEC 62878 is applicable to device embedded substrates fabricated by use oforganic base material, which include for example active or passive devices, discretecomponents formed in the fabrication process of electronic wiring board, and sheet formedcomponents.

The IEC 62878 series does not apply to the re-distribution layer (RDL) nor to the electronicmodules defined as an M-type business model in IEC 62421.

Cross References:
IEC 62878-1

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